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Noise characteristics of single grain boundary junction DC SQUIDs in Y1Ba2Cu3O7−δ films

✍ Scribed by R. Gross; P. Chaudhari; M. Kawasaki; M. Ketchen; A. Gupta

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
278 KB
Volume
170
Category
Article
ISSN
0921-4534

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The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of t