✦ LIBER ✦

Noise characteristics of ionizing-radiation-stressed MOSFET devices

✍ Scribed by P.S. Neelakantaswamy; R.I. Turkman

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effects of ionizing radiation on MOS dev

✍ B. Andre; J. Buxo; D. Esteve; H. Martinot 📂 Article 📅 1969 🏛 Elsevier Science 🌐 English ⚖ 487 KB

Characteristics of diamond detectors of

✍ V. S. Khrunov; S. S. Martynov; N. P. Marchenko; S. M. Vatnitskii; I. A. Ermakov 📂 Article 📅 1988 🏛 Springer US 🌐 English ⚖ 415 KB

The effect of channel hot electron stres

✍ A. Kalnitsky; S. Sharma 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 413 KB

Low-frequency noise characteristics of l

✍ Sheng-Lyang Jang; Ping-Chen Chang 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 285 KB

Modeling of ionizing radiation effect on

✍ Sh. M. Eladl 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 378 KB

The dynamic characteristics of dielectri

✍ V. I. Arkhipov; I. A. Perova 📂 Article 📅 1992 🏛 Springer US 🌐 English ⚖ 472 KB