𝔖 Bobbio Scriptorium
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Noise and y-parameters in mos fet's

✍ Scribed by P.S. Rao; A. Van Der Ziel


Book ID
107855968
Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
454 KB
Volume
14
Category
Article
ISSN
0038-1101

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## Abstract A fast and accurate method to determine the noise parameters of microwave FETs, based on a new expression of the device noise figure as a function of the __Y__‐parameters and two equivalent noise temperatures, is presented. The method requires only the measured small‐signal parameters a