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Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

✍ Scribed by S. Sánchez Majos; P. Achenbach; C. Ayerbe Gayoso; J.C. Bernauer; R. Böhm; M.O. Distler; M. Gómez Rodríguez de la Paz; H. Merkel; U. Müller; L. Nungesser; J. Pochodzalla; B.S. Schlimme; Th. Walcher; M. Weinriefer; C.J. Yoon


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
786 KB
Volume
602
Category
Article
ISSN
0168-9002

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