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Nitrogen K-edge EXAFS measurements on Mg- and Si-doped GaN

✍ Scribed by Katsikini, M. ;Moustakas, T. D. ;Paloura, E. C.

Book ID: 111752017
Publisher: International Union of Crystallography
Year: 1999
Tongue: English
Weight: 333 KB
Volume: 6
Category: Article
ISSN: 0909-0495
DOI: 10.1107/s0909049598014423

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