𝔖 Bobbio Scriptorium

✦ LIBER ✦

Ni-Cr Resistor contact reliability : R. K. Waits, T. Cass and O. Uyeda. Proc. IEEE Reliab. Phys. Symp. Las Vegas, U.S.A., 31 March–2 April (1971)

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 108 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90019-9

No coin nor oath required. For personal study only.

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Applications determine the design, mater

Applications determine the design, materials, processes and package : G. R. Madland, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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Invited talk : by Dr. Igor T. Aleksanyan

Invited talk : by Dr. Igor T. Aleksanyan, Moscow Institute of Electronic Technology. Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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Thermal excursion can cause bond problem

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Reliability of Al2O3-SiO2 IGFET integrat

Reliability of Al2O3-SiO2 IGFET integrated circuits : G. T. Cheney, R. L. Freyman and A. A. Mammele. Proc. IEEE Reliab. Phys. Symp., Las Vegas, USA. 31 March–2 April (1971)

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Degradation and passivation of light emi

Degradation and passivation of light emitting diodes : R. L. Hartman, M. Kuhn and B. Schwartz, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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Reliability studies of MOS Si-gate array

Reliability studies of MOS Si-gate arrays : D. J. Fitzgerald, G. H. Parker and P. Spiegel, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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