𝔖 Bobbio Scriptorium

✦ LIBER ✦

Degradation and passivation of light emitting diodes : R. L. Hartman, M. Kuhn and B. Schwartz, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 111 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90135-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Applications determine the design, mater

Applications determine the design, materials, processes and package : G. R. Madland, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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Thermal excursion can cause bond problem

Thermal excursion can cause bond problems : M. F. Nowakowski and F. Villella, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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Ni-Cr Resistor contact reliability : R.

Ni-Cr Resistor contact reliability : R. K. Waits, T. Cass and O. Uyeda. Proc. IEEE Reliab. Phys. Symp. Las Vegas, U.S.A., 31 March–2 April (1971)

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The SEM as a defect analysis tool for se

The SEM as a defect analysis tool for semiconductor memories : B. A. McDonald and M. J. Alter, Proc. IEEE Reliab. Phys. Symp., Las Vegas, U.S.A. 31 March–2 April (1971)

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Electromigration damage in AlCu thin fi

Electromigration damage in AlCu thin films : L. Berenbaum and R. Rosenberg. Proc. IEEE Reliab. Phys. Symp., Las Vegas, USA, 31 March–2 April (1971)

📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 109 KB

A mechanism of evaluation in MAOS system

A mechanism of evaluation in MAOS systems : C. Jund, B. Kervella and J. Grosvalet. Proc. IEEE Reliab. Physics Symp., Las Vegas, U.S.A., 31 March–2 April (1971)

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 110 KB