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New structural aspects of Tl2Ba2CaCu2Oy epitaxial thin films grown by MOCVD on LaAlO3

✍ Scribed by X.F. Zhang; Y.S. Sung; D.J. Miller; B.J. Hinds; R.J. McNeely; D.L. Studebaker; T.J. Marks

Book ID
108465782
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
720 KB
Volume
275
Category
Article
ISSN
0921-4534

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Laue oscillations) appear close to the high-angle reflections. The film thickness can then be evaluated as: where W i and W i-1 are positions of adjacent satellite maxima.