New Reliability-Based Robust Design Optimization Algorithms for Electromagnetic Devices Utilizing Worst Case Scenario Approximation

✍ Scribed by Ren, Ziyan; Zhang, Dianhai; Koh, Chang-Seop

• Book ID: 121315669
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 758 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/TMAG.2013.2238906