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New Reliability-Based Robust Design Optimization Algorithms for Electromagnetic Devices Utilizing Worst Case Scenario Approximation

โœ Scribed by Ren, Ziyan; Zhang, Dianhai; Koh, Chang-Seop


Book ID
121315669
Publisher
IEEE
Year
2013
Tongue
English
Weight
758 KB
Volume
49
Category
Article
ISSN
0018-9464

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