A New Reliability Calculation Algorithm Based on Sensitivity Analysis and its Application to Reliability-Based Robust Global Optimization of Electromagnetic Device with Uncertain Design Variables

✍ Scribed by Ren, Zi Yan; Zhang, Dian Hai; Pham, Minh Trien; Koh, Chang Seop

• Book ID: 120440103
• Publisher: Trans Tech Publications, Ltd.
• Year: 2012
• Tongue: English
• Weight: 515 KB
• Volume: 721
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/MSF.721.165