New Non-Scan DFT Techniques to Achieve 100% Fault Efficiency

✍ Scribed by Debesh Kumar Das; Satoshi Ohtake; Hideo Fujiwara

• Book ID: 111589213
• Publisher: Springer US
• Year: 2004
• Tongue: English
• Weight: 134 KB
• Volume: 20
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/b:jett.0000029464.22206.0c