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A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency

✍ Scribed by Satoshi Ohtake; Toshimitsu Masuzawa; Hideo Fujiwara

Book ID: 110262291
Publisher: Springer US
Year: 2000
Tongue: English
Weight: 440 KB
Volume: 16
Category: Article
ISSN: 0923-8174
DOI: 10.1023/a:1008333102734

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📜 SIMILAR VOLUMES

New Non-Scan DFT Techniques to Achieve 1

New Non-Scan DFT Techniques to Achieve 100% Fault Efficiency

✍ Debesh Kumar Das; Satoshi Ohtake; Hideo Fujiwara 📂 Article 📅 2004 🏛 Springer US 🌐 English ⚖ 134 KB

A nonscan DFT method for controllers to

A nonscan DFT method for controllers to provide complete fault efficiency

✍ Satoshi Ohtake; Toshimitsu Masuzawa; Hideo Fujiwara 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 252 KB

## Abstract In this paper, we propose a method for non‐scan design for testability of controllers that are logically synthesized from a finite state machine (FSM), which provides complete fault efficiency. In the previously used scan method, a test pattern for the combinational circuits of a contro