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New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

✍ Scribed by S. Kodaira; N. Yasuda; N. Hasebe; T. Doke; S. Ota; K. Ogura


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
620 KB
Volume
574
Category
Article
ISSN
0168-9002

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