Erratum to “New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector”: [Nucl. Instr. and Meth. A 574 (2007) 163–170]

✍ Scribed by S. Kodaira; N. Yasuda; N. Hasebe; T. Doke; S. Ota; K. Ogura

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 77 KB
• Volume: 593
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2008.05.053