Reliability assessment of beam-lead seal
✦ LIBER ✦
New metallization process for tantalum RC hybrid integrated circuits : R. E. Peterson and K. L. Baurle. Proc. Electron. Component Conf. Arlington, Va., (May 16–18 1977). p. 238
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 131 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0026-2714
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