Challenges for signal integrity predicti
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Xavier Aragones; Antonio Rubio
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Article
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2003
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Elsevier Science
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English
โ 443 KB
Noise caused by the activity of integrated circuits is a limiting factor for the development of future VLSI circuits. Transients of voltages and currents couple perturbations to the co-integrated circuits where the most effective medium to propagate noise is the silicon substrate. The effect is espe