Scanning force microscopy is extended by the pulsed force mode from simple imaging of topography to measuring elastic, electrostatic and adhesive sample properties. Lateral forces are virtually eliminated so that mapping of delicate samples with high resolution in air and Γuids is easily possible. S
New asymptotic method for nonuniform grating investigation
β Scribed by G. G. Karapetyan
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 170 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
β¦ Synopsis
A general partial two-port calibration scheme for transmission parameter measurement has been described. Two important calibration techniques, TL and TM, have been derived from this general scheme. Although TL calibration has been previously proposed and verified in another work, from a different formulation, its appearance here is interesting. In contrast, TM calibration, which is a new result, has been checked experimentally against TL calibration, and an excellent agreement has been observed. Both the scheme and its applications are interesting and useful in two-port transmission measurement.
π SIMILAR VOLUMES
Fiber-optic evanescent wave Fourier transform infrared spectroscopy (FEW-FTIR) is a new method developed for di β erent applications for surface analysis of materials, including the diagnostics of skin and living tissues. Our technique allows for the detection of inconsistencies in the molecular stru