In diffraction tomography (DT), the measured scattered data are unavoidably contaminated by noise. Because the detectability of an object in a noisy image relies strongly on the signal-to-noise ratio, it is important in certain applications to reduce the statistical variation in the reconstructed im
Pulsed force mode: a new method for the investigation of surface properties
โ Scribed by Krotil, Hans-Ulrich; Stifter, Thomas; Waschipky, Hanka; Weishaupt, Klaus; Hild, Sabine; Marti, Othmar
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 460 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0142-2421
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โฆ Synopsis
Scanning force microscopy is extended by the pulsed force mode from simple imaging of topography to measuring elastic, electrostatic and adhesive sample properties. Lateral forces are virtually eliminated so that mapping of delicate samples with high resolution in air and รuids is easily possible. Scanning speed is comparable to that in contact mode. The new opportunities for scanning force microscopy given by the pulsed force mode is demonstrated in selected applications.
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