New approach to bias scan DLTS for rapid evaluation of interface states in MOS structures

✍ Scribed by Serhat Özder; ⌟smail Atilgan; Bayram Katircioḡlu

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 590 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(96)00053-6