Analytic approach to the a.c. conductance method for rapid characterization of interface states in MOS structures

✍ Scribed by R.D.S. Yadava

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 1008 KB
• Volume: 33
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(90)90018-a