Neutron induced defects in silicon detectors characterized by DLTS and TSC methods

✍ Scribed by E. Fretwurst; C. Dehn; H. Feick; P. Heydarpoor; G. Lindström; M. Moll; C. Schütze; T. Schulz

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 524 KB
• Volume: 377
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(95)01405-5