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Near-field of a scanning aperture microwave probe: a 3-D finite element analysis

✍ Scribed by Golosovsky, M.; Maniv, E.; Davidov, D.; Frenkel, A.

Book ID: 114629130
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 400 KB
Volume: 51
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2002.806006

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