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Enhancing the resolution of scanning near-field optical microscopy by a metal tip grown on an aperture probe

✍ Scribed by Frey, Heinrich G.; Keilmann, Fritz; Kriele, Armin; Guckenberger, Reinhard

Book ID: 121004550
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 515 KB
Volume: 81
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1530736

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