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Near-edge x-ray absorption fine structure study of bonding modifications in BN thin films by ion implantation

✍ Scribed by JimeÌnez, I.; Jankowski, A.; Terminello, L. J.; Carlisle, J. A.; Sutherland, D. G. J.; Doll, G. L.; Mantese, J. V.; Tong, W. M.; Shuh, D. K.; Himpsel, F. J.

Book ID: 120221785
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 297 KB
Volume: 68
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.116334

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