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Natural and artificial grain boundaries of YBCO thin films for josephson junctions

✍ Scribed by Hajime Suzuki; Yasuaki Fujiwara; Yoshihiko Hirotsu; Jian Chen; Kensuke Nakajima; Tsutomu Yamashita


Book ID
108465590
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
901 KB
Volume
190
Category
Article
ISSN
0921-4534

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Orientation dependence of grain-boudary
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The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of t