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Native point defects at ZnO surfaces, interfaces and bulk films

✍ Scribed by Leonard J. Brillson; Y. Dong; F. Tuomisto; B. G. Svensson; A. Yu. Kuznetsov; D. Doutt; H. L. Mosbacker; G. Cantwell; J. Zhang; J. J. Song; Z.-Q. Fang; D. C. Look

Book ID: 112182353
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 830 KB
Volume: 9
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.201100538

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