✦ LIBER ✦
Effect of Deep-Level Defects on Surface Recombination Velocity at the Interface Between Silicon and Dielectric Films
✍ Scribed by Imangholi, B.; Fee Li Lie; Parks, H.G.; Muscat, A.J.
- Book ID
- 114619929
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 628 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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