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Nanoscale Patterning of Alkyl Monolayers on Silicon Using the Atomic Force Microscope

✍ Scribed by Headrick, Jill E.; Armstrong, Matt; Cratty, Justin; Hammond, Stephanie; Sheriff, Bonnie A.; Berrie, Cindy L.

Book ID: 127095811
Publisher: American Chemical Society
Year: 2005
Tongue: English
Weight: 217 KB
Volume: 21
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la0481905

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