Chemical Approach to High-Resolution Patterning on Self-Assembled Monolayers Using Atomic Force Microscope Lithography

✍ Scribed by Lee, Wonbae; Kim, Eung Ryul; Lee, Haiwon

• Book ID: 127341768
• Publisher: American Chemical Society
• Year: 2002
• Tongue: English
• Weight: 155 KB
• Volume: 18
• Category: Article
• ISSN: 0743-7463
• DOI: 10.1021/la0115076