Nanoscale imaging with an integrated system combining stimulated emission depletion microscope and atomic force microscope

✍ Scribed by JianQiang Yu,JingHe Yuan,XueJie Zhang,JianLi Liu…

• Book ID: 126360018
• Publisher: Springer
• Year: 2013
• Tongue: English
• Weight: 890 KB
• Volume: 58
• Category: Article
• ISSN: 1001-6538
• DOI: 10.1007/s11434-013-6011-z