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Nanometer scale patterning using focused ion beam milling

✍ Scribed by Petit, D.; Faulkner, C. C.; Johnstone, S.; Wood, D.; Cowburn, R. P.

Book ID
120554329
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
459 KB
Volume
76
Category
Article
ISSN
0034-6748

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