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[Nano Science and Technolgy] Applied Scanning Probe Methods VIII || Kelvin Probe Force Microscopy: Recent Advances and Applications

✍ Scribed by Bhushan, Bharat; Fuchs, Harald; Tomitori, Masahiko

Book ID: 120399578
Publisher: Springer Berlin Heidelberg
Year: 2008
Weight: 948 KB
Category: Article
ISBN: 3540740805
DOI: 10.1007/978-3-540-74080-3_10

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