✦ LIBER ✦
[NanoScience and Technology] Applied Scanning Probe Methods II Volume 14 || Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices
✍ Scribed by Bhushan, Bharat; Fuchs, Harald
- Book ID
- 115448277
- Publisher
- Springer Berlin Heidelberg
- Year
- 2006
- Tongue
- German
- Weight
- 741 KB
- Edition
- 2006
- Category
- Article
- ISBN-13
- 9783540262428
No coin nor oath required. For personal study only.
✦ Synopsis
Bharat Bhushan, Harald Fuchs (eds.).