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Nano-material processing with laser radiation in the near field of a scanning probe tip

✍ Scribed by J. Jersch; F. Demming; J. Hildenhagen; K. Dickmann

Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 366 KB
Volume: 29
Category: Article
ISSN: 0030-3992
DOI: 10.1016/s0030-3992(97)00051-0

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✦ Synopsis

We report preliminary results of using a scanning probe microscope/laser combination to perform nanostructuring on insulator and metal surfaces in air. This technique enables processing of structures with a lateral resolution of approximately 10 nm. In this paper we present our last structuring results with both scanning tunnelling and scanning force microscopy. Some possible interaction mechanisms responsible for the structuring will be discussed.

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Current research work has shown that "focusingÏ of laser radiation down to a few nanometres can be achieved by using near-Ðeld technology, e.g. scanning tunnelling microscopy (STM) or atomic force microscopy (AFM), in combination with a laser. Lateral external illumination of a probe tip with laser