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Focusing of Laser Radiation in the Near-field of a Tip (FOLANT) for Applications in Nanostructuring

✍ Scribed by Dickmann, Klaus; Jersch, Johann; Demming, Frank

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
677 KB
Volume
25
Category
Article
ISSN
0142-2421

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✦ Synopsis

Current research work has shown that "focusingÏ of laser radiation down to a few nanometres can be achieved by using near-Ðeld technology, e.g. scanning tunnelling microscopy (STM) or atomic force microscopy (AFM), in combination with a laser. Lateral external illumination of a probe tip with laser radiation can cause a tremendous intensity enhancement of up to 5 Â 105 in the near-Ðeld underneath the probe tip. This e †ect can be explained by di †erent electrostatic as well as electrodynamic e †ects known from surface-enhanced raman spectroscopy (SERS). This enhancement e †ect was utilized to concentrate laser radiation with high intensity between a tip and a substrate. This FOLANT (focusing of laser radiation in the near-Ðeld of a tip) technique can be applied for material processing on a nanometre scale. Using an STM/laser combination, hillocks, pits and grooves with lateral dimensions down to 10 nm have been obtained on gold substrates. The AFM/laser combination enabled nanostructures down to 20 nm to be established on dielectric materials such as polycarbonate.

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