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N- and Ga-K-edge XAFS study of the effect of annealing on In implanted GaN

✍ Scribed by Katsikini, M.; Pinakidou, F.; Paloura, E. C.


Book ID
118766662
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
321 KB
Volume
10
Category
Article
ISSN
1862-6351

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