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Mutation Testing Cost Reduction Techniques: A Survey

✍ Scribed by Usaola, M.P.; Mateo, P.R.

Book ID: 119812173
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 927 KB
Volume: 27
Category: Article
ISSN: 0740-7459
DOI: 10.1109/ms.2010.79

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