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Muon trapping and diffusion in Al and In after electron irradiation at 9 K

✍ Scribed by N. Haas; D. Herlach; W. Jacobs; H. -J. Mundinger; J. Rosenkranz; H. -E. Schaefer; M. Schmolz; A. Seeger; K. -P. Döring; K. Fürderer; M. Gladisch

Book ID: 112744425
Publisher: Springer
Year: 1986
Tongue: English
Weight: 381 KB
Volume: 31
Category: Article
ISSN: 0304-3843
DOI: 10.1007/bf02401562

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