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Muon diffusion and trapping by defects in electron-irradiated Nb and Ta

✍ Scribed by T. Aurenz; K. -P. Arnold; K. -P. Döring; M. Gladisch; N. Haas; D. Herlach; W. Jacobs; M. Krause; M. Krauth; H. Orth; H. -E. Schaefer; K. Schulze; A. Seeger

Book ID: 112684455
Publisher: Springer
Year: 1984
Tongue: English
Weight: 261 KB
Volume: 17
Category: Article
ISSN: 0304-3843
DOI: 10.1007/bf02065901

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