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Multistable current–voltage characteristics a fingerprints of growth-related imperfections in semiconductor superlattices

✍ Scribed by G. Schwarz; M. Patra; F. Prengel; E. Schöll

Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 278 KB
Volume: 23
Category: Article
ISSN: 0749-6036
DOI: 10.1006/spmi.1996.0243

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✦ Synopsis

The influence of imperfections and growth-related disorder on the current-voltage characteristics of doped superlattices is investigated theoretically. It is demonstrated that the location of a defect can be directly identified from the current measurements. Such measurements can also be used as an estimate for the degree of microscopic disorder.

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