✦ LIBER ✦

Multiple scattering justifies depth dependence of critical angles

✍ Scribed by S.U Campisano; G Foti; F Grasso; E Rimini

Book ID: 103766518
Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 148 KB
Volume: 35
Category: Article
ISSN: 0375-9601
DOI: 10.1016/0375-9601(71)90576-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Multiple-scattering enhanced depth sensi

Multiple-scattering enhanced depth sensitivity of angle-resolved photoemission extended fine structure

✍ Y. Zheng; D.A. Shirley 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 451 KB

We show by analysis of experimental results that, in the structural study of adsorbed surfaces, the angle-resolved photoemission extended tine structure (ARPEFS) technique has a strong depth sensitivity that can yield unique information about adsorbateinduced substrate near-surface relaxation. Furth

Critical surface scattering of x-rays at

Critical surface scattering of x-rays at grazing angles

✍ S. Dietrich; H. Wagner 📂 Article 📅 1984 🏛 Springer 🌐 English ⚖ 738 KB

Critical magnetic surface scattering of

Critical magnetic surface scattering of neutrons at grazing angles

✍ S. Dietrich; H. Wagner 📂 Article 📅 1985 🏛 Springer 🌐 English ⚖ 630 KB

Critical angles of X-ray scattering in t

Critical angles of X-ray scattering in total reflection

✍ Y. Yoneda 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 174 KB

Decorrelation of multiple scattering for

Decorrelation of multiple scattering for an arbitrary scattering angle

✍ Drewel, M.; Ahrens, J.; Podschus, U. 📂 Article 📅 1990 🏛 Optical Society of America 🌐 English ⚖ 673 KB

Depth distribution of multiple order X-r

Depth distribution of multiple order X-ray scatter

✍ Weiguang Yao; Konrad Leszczynski 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 277 KB