✦ LIBER ✦

Multiple-scattering enhanced depth sensitivity of angle-resolved photoemission extended fine structure

✍ Scribed by Y. Zheng; D.A. Shirley

Book ID: 103030996
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 451 KB
Volume: 203
Category: Article
ISSN: 0009-2614
DOI: 10.1016/0009-2614(93)85373-v

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✦ Synopsis

We show by analysis of experimental results that, in the structural study of adsorbed surfaces, the angle-resolved photoemission extended tine structure (ARPEFS) technique has a strong depth sensitivity that can yield unique information about adsorbateinduced substrate near-surface relaxation. Furthermore, we show by theoretical calculations that, in contrast to the generally accepted picture, the enhanced depth sensitivity of ARPEFS arises largely from multiple-scattering effects.

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