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Multiple scattering calculations of the XANES Si K-edge in amorphous silica

✍ Scribed by C Levelut; D Cabaret; M Benoit; P Jund; A.-M Flank


Book ID
117145139
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
109 KB
Volume
293-295
Category
Article
ISSN
0022-3093

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Using a YB66 monochromator X-ray absorption measurements were carried out at the AI K and Si K absorption edges of a series of aluminosilicate sodalites. The A1-O-Si bridging angle of the selected sodalites varies from 138 Β° to 148 Β° and the structure of the XANES with its different multiple scatter