Correlation of multiple scattering features in XANES spectra of Al and Si K edges to the AlOSi bond angle in aluminosilicate sodalites: An empirical study
✍ Scribed by M. Fröba; J. Wong; P. Behrens; P. Sieger; M. Rowen; T. Tanaka; Z. Rek; J. Felsche
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 158 KB
- Volume
- 208-209
- Category
- Article
- ISSN
- 0921-4526
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✦ Synopsis
Using a YB66 monochromator X-ray absorption measurements were carried out at the AI K and Si K absorption edges of a series of aluminosilicate sodalites. The A1-O-Si bridging angle of the selected sodalites varies from 138 ° to 148 ° and the structure of the XANES with its different multiple scattering (MS) features shows a strong angular dependence. Increasing the angle results in a decrease of the MS intensities. This dependence is especially pronounced at the A1 K edges which contain a couple of separated well-resolved peaks whereas the corresponding features at the Si K edges are smeared out due to a strong overlapping of the peaks.