Surface analysis by total-reflection X-r
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Héctor J. Sanchez; Carlos A. Perez; Roberto D. Perez; Marcelo Rubio
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Article
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1996
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Elsevier Science
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English
⚖ 523 KB
Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental