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MOSFET Degradation Under RF Stress

✍ Scribed by Sasse, G.T.; Kuper, F.G.; Schmitz, J.

Book ID: 114619177
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 235 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.2004650

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applications in the terahertz spectra. Future works will address realization and characterization of such a system and the microfluidic management operation.