✦ LIBER ✦
Calibration 90 nm node RF MOSFETs, including stress degradation
✍ Scribed by H. L. Kao; C. H. Kao; A. Chin; C. C. Liao
- Book ID
- 102522375
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 287 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0895-2477
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