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MOSFET degradation due to stressing of thin oxide

✍ Scribed by Mong-Song Liang; Chi Chang; Yew Tong Yeow; Chenming Hu; Brodersen, R.W.

Book ID: 114594849
Publisher: IEEE
Year: 1984
Tongue: English
Weight: 689 KB
Volume: 31
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1984.21694

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