๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

Morphology Control of Materials and Nanoparticles: Advanced Materials Processing and Characterization

โœ Scribed by F. Saito, M. Baron, J. Dodds (auth.), Professor Yoshio Waseda, Professor Atsushi Muramatsu (eds.)


Publisher
Springer-Verlag Berlin Heidelberg
Year
2004
Tongue
English
Leaves
270
Series
Springer Series in Materials Science 64
Edition
1
Category
Library

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โœฆ Synopsis


A broad array of new engineered materials, with intricate atomic and molecular architecture for sophisticated functional applications in the computer and electronics industries, is under development. For this purpose, there is an urgent need for novel methods for precisely controlling the morphology of particulate materials. This book represents an extended introductory treatise on the fundamental aspects, new methods for the precise control of morphology (size, shape, composition, structure etc.) and accurate materials characterization, from both the basic science and the applied engineering viewpoints. This is the first major compilation of new advances covering the current status and topics related to the processing and production of precisely controlled materials. It provides a unique source of information and guidance for specialists and non-specialists alike.

โœฆ Table of Contents


Front Matter....Pages I-XV
Front Matter....Pages 1-1
Morphology Control in Size Reduction Processes....Pages 3-23
Liquid-Phase Processing....Pages 25-62
Front Matter....Pages 63-63
Stratified Materials Synthesized in the Liquid Phase....Pages 65-84
Well-Dispersed Bimetallic Nanoparticles....Pages 85-112
Porous Materials Controlled in Shape....Pages 113-128
Surface Control....Pages 129-149
Front Matter....Pages 151-151
Fundamentals of Characterization....Pages 153-181
Photocatalytic Properties: Effect of Size, Shape and Surface Structures of Fine Particles....Pages 183-200
Surface Characteristics....Pages 201-222
Structural Characterization of Surface and Morphology of Materials Using X-ray Scattering....Pages 223-255
Back Matter....Pages 257-264

โœฆ Subjects


Mechanical Engineering; Theoretical and Applied Mechanics; Surface and Interface Science, Thin Films; Characterization and Evaluation of Materials; Condensed Matter Physics; Nanotechnology


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