Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

✍ Scribed by Ch Sateesh Kumar, M. Muralidhar Singh, Ram Krishna

• Publisher: CRC Press
• Year: 2023
• Tongue: English
• Leaves: 145
• Edition: 1
• Category: Library

✦ Synopsis

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, Fourier Transfer Infrared Spectroscopy, Differential Scanning Calorimeter, Profilometer, and Thermogravimetric analysis.

Features:

• Covers material characterization techniques and the development of advanced characterization technology
• Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
• Discusses advanced material characterization technology in the microstructural and property characterization fields
• Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
• Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

✦ Table of Contents

Cover
Half Title
Series Information
Title Page
Copyright Page
Table of Contents
Preface
Acknowledgments
About the Authors
Introduction
1 Introduction to Material Characterization
1.1 Application of Advanced Characterization Technologies
1.1.1 Microscopy
1.1.2 Spectroscopy
1.2 Characterization Instruments
1.3 Advanced Materials and Characterization
1.4 Summary
References
2 X-Ray Diffraction (XRD)
2.1 Construction of X-Ray Diffractometer
2.2 Working Principle
2.3 Diffraction Theory
2.4 Scattering Techniques
2.5 SIO2 Glass
2.6 Applications
2.7 Summary
References
3 Nanomechanical System
3.1 Construction
3.2 Working Principle
3.3 Applications
3.4 Summary
References
4 X-Ray Photo Spectroscopy (XPS)
4.1 Construction
4.2 Working Principle
4.3 Instrumentation
4.4 Application
4.4.1 Depth Profiling
4.5 Summary
References
5 Scanning Electron Microscope (SEM)
5.1 Construction
5.2 Working Principle
5.3 Sample Preparation
5.4 Application
5.5 Summary
References
6 Field Emission Scanning Electron Microscope (FESEM)
6.1 Construction
6.2 Working Principle
6.3 Sample Preparation
6.4 Application
6.5 Summary
References
7 Transmission Electron Microscope (TEM)
7.1 Construction
7.2 Working Principle
7.3 Sample Preparation
7.4 Application
7.5 Summary
References
8 Atomic Force Microscope (AFM)
8.1 Construction
8.2 AFM Working Principle
8.3 Application
8.4 Summary
References
9 Near-Field Scanning Optical Microscope Raman
9.1 Construction
9.2 Working Principle
9.3 Application
9.4 Summary
References
10 Optical Characterization Instruments
10.1 Construction
10.2 Working Principle
10.3 Application
10.4 Summary
References
11 Synchrotron Techniques
11.1 Protein Crystallography
11.2 X-Ray Scattering
11.2.1 Scattering Techniques Based On X-Rays
11.3 X-Ray Absorption Spectroscopy (XAS)
11.4 Photoelectron Spectroscopy
11.5 Infrared Spectroscopy
11.5.1 Dispersive Spectrometers
11.5.2 Spectroscopic Design
11.5.3 Fourier Transform Spectrometers
11.5.4 Spectrometer Design
11.5.5 Advantages of FTIR
11.6 Circular Dichroism
11.6.1 Instrumentation
11.7 X-Ray Microprobe
11.8 Summary
References
12 Other Advanced Instruments Used for Characterization of Functionally Graded Materials
12.1 Near-Edge X-Ray Absorption Fine Structure (NEXAFS)
12.2 Extended X-Ray Absorption Fine Structure
12.3 Summary
References